This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
Spherical aberration coefficient (Cs) defines the quality of objective lens. The accurate determination of the spherical aberration coefficient Cs is very important to many applications of EM techniques, such as electron holography [1, 2], image processing and deconvolution , and electron crystallography of proteins .
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