Secondary Electron Energy Spectroscopy
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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Figure 3832a shows the generation of secondary electrons (SEs) and kinetic energies of the emitted SEs. EKE1 and EKE2 represent the kinetic energies of the two generated SEs. The kinetic energy of the generated SEs is normally in the range of 0 to 50 eV. ΔE1 and ΔE2 represent the energy losses of the incident electrons after the incident electrons interact with the electrons in the K and L3 subshells, respectively. E1 and E2 are the binding energies of the two electrons. E0 is the energy of the incident electrons in the EMs.

The generation of secondary electrons (SEs) and kinetic energies of the emitted SEs 

Figure 3832a. The generation of secondary electrons (SEs) and kinetic energies of the emitted SEs.

As shown in Figure 3832b, the SE (secondary electron) energy spectroscopy, which is the relative SE number as a function of the SE energy (N(E)), is characterized by the most probable energy (eVmp) and the full width at half maximum (FWHM). The spectroscopy generally varies in a range with the composition of the materials and surface condition.

Schematic illustration of SE (secondary electron) energy spectroscopy. most probable energy (eVmp) and the full width at half maximum (FWHM)

Figure 3832b. Schematic illustration of SE (secondary electron) energy spectroscopy.

 

 

 

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