Zero-order Disk of CBED Patterns
- Practical Electron Microscopy and Database -
- An Online Book -

https://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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CBED (convergent beam electron diffraction) measurements need very high pixel resolution for recording the diffraction patterns. The camera length normally should be selected as high as possible to obtain a highly resolved pattern. In this case, the zero-order disk of the CBED patterns can almost cover the entire CCD camera.

 

 

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