This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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Computer-assisted imaging and analysis has been proven to play an important role on highly accurate quantification of distribution of grain orientations. For instance, the orientation of individual grains can be determined by detecting the position of Kikuchi bands in electron backscattering patterns. Thousands of patterns can be captured and evaluated so that the grain orientations can be mapped [1].

[1] Schwarzer, R.A. (1997) Automated crystal lattice orientation mapping using a computer-controlled SEM. Micron, 28 (3), 249–265.