Poor TEM Sample Quality Limiting Data Interpretation
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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One critical limiting factor to quantitative analysis and data interpretations in TEM measurements is the occurrence of amorphous surface layers generated during the sample preparation [1].

 

[1] J.P. Chevalier, M.J. Hÿtch, Ultramicroscopy 52 (1994) 253.

 

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