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Poor TEM Sample Quality Limiting Data Interpretation
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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One critical limiting factor to quantitative analysis and data interpretations in TEM measurements is the occurrence of amorphous surface layers generated during the sample preparation [1].
[1] J.P. Chevalier, M.J. Hÿtch, Ultramicroscopy 52 (1994)
253.
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