Single Particle Analysis in TEM and STEM tomography
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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One type of TEM tomography methods is called single particle analysis. In this method, it can be assumed that a set of separated objects, for instance particles dispersed on a carbon film are all identical but distribute over all possible orientations with respect to the electron beam direction.

 

 

 

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