Single Particle Analysis in TEM and STEM tomography
- Practical Electron Microscopy and Database -
- An Online Book -  


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.



One type of TEM tomography methods is called single particle analysis. In this method, it can be assumed that a set of separated objects, for instance particles dispersed on a carbon film are all identical but distribute over all possible orientations with respect to the electron beam direction.





The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. This appearance can help advertise your publication.

Copyright (C) 2006 GlobalSino, All Rights Reserved