This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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For a sample consisting of nano-particles, the specimen thickness can be estimated from their projected shape and size. Except that basic requirements of TEM specimen need to be paid attention to, additional requirements for the TEM specimen of nano-particles is:
         The overall thickness of the specimen (including the supporting film and the nano-particles) can satisfy the basic thickness constraints (Refer to basic requirements of TEM specimen).

For particles and powders, sectioning using microtome can be performed by embedding the particles in resin. In this case, the hardness of the resin should be adjusted to match that of resin in order to avoid the particles, e.g. pine seeds, coming out from the resin during sectioning.