Cold Trap to Prevent Contamination of TEM Specimen
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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Figure 4212 shows a cold trap is used in the specimen TEM chamber to prevent contamination of the TEM specimen on a FEI TEM system.

Cold Traps

Figure 4212. Cold trap to prevent contamination of the TEM specimen.

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.