Space-Charge Effect in Electron Beam
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. You can click How to Cite This Book to cite this book. Please let Dr. Liao know once you have cited this book so that the brief information of your publication can appear on the “Times Cited” page. This appearance can also help advertise your publication.

 

=================================================================================

Assuming no external force is applied to an electron beam in vacuum, the electrons at the edge of the electron beam suffer two forces: outward force from the electrical field due to space charge and inward force due to the azimuthal magnetic field formed by the current of the electron beam. The net positive outward force Fr acting on an electron is given by [1],

          Fr = e2ne(1-vz2/c2)/2πε0rb ------------------------------- [4249]

where,
          e – Electron charge
          ne – Electron density in the beam (electrons per unit axial length)
          vz – Electron velocity
          c – Speed of light
          ε0 -- Permittivity of of vacuum
          rb -- Beam radius

Therefore, the beam tends to expand as it propagates in vacuum due to the net positive outward force induced by the space-charge effect. However, electron beams can travel with constant beam diameters when the velocity of the electrons becomes equal to that of light (vz= c in Equation 4249).

 

[1] Hidenori Matsuzawa, Novel magnetic applications of high - Tc bulk superconductors: Lenses for electron beams, J. Appl. Phys. 74 (12), R111 (1993).

 

=================================================================================

The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission.



 
 
 
Copyright (C) 2006 GlobalSino, All Rights Reserved