Electron Collision with Matter in TEM
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. You can click How to Cite This Book to cite this book. Please let Dr. Liao know once you have cited this book so that the brief information of your publication can appear on the “Times Cited” page. This appearance can also help advertise your publication.

 

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For TEM (transmission electron microscope), the primary electron beam typically with voltages of 100 to 300 keV at convergence half angle α interacts with a specimen sufficiently thin so that the number of collision events remains low.

 

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The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission.



 
 
 
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