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Sputtering of Silver from Electron Irradiation in EMs
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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Preferential Electron-Beam Etching of Grain Boundaries can provide an explanation for the small but measurable sputtering observed from silver nnanoparticles (e.g. 6 – 14 nm in diameter) when exposed to 200 keV electrons [1].
[1] N. Braidy, Z. J. Jakubek, B. Simard, G. A. Botton, Microsc. Microanalysis 14 (2008) 166.
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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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