Local Heating/Temperature Rise Induced by Ion and Electron Beams
- Practical Electron Microscopy and Database -
- An Online Book -

https://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. How to Cite This Book

 

=================================================================================

Local heating induced by energetic ion and electron beams [1,2] leads to various effects such as bending of nanopillars [3], diffusion of substrate atoms into the nanostructures [4], enhancement of the adhesion between thin films [5–7] and focused ion beam lithography for MOSFET devices [8].

 

[1] Y.M. Parka, D.S. Koa, K.W. Yia, I. Petrovb, Y.W. Kim, Ultramicroscopy 107 (2007) 663.
[2] D.F. Peach, D.W. Lane, M.J. Sellwood, Nucl. Instrum. Methods B 249 (2006) 677.
[3] S.K. Tripathi, N. Shukla, S. Dhamodaran, V.N. Kulkarni, Nanotechnology 19 (2008) 205302.
[4] S.K. Tripathi, N. Shukla, V.N. Kulkarni, Nanotechnology 19 (2008) 465302.
[5] N. Shukla, S.K. Tripathi, M. Sarkar, N.S. Rajput, V.N. Kulkarni, Nucl. Instrum. Methods B 267 (2009) 1376.
[6] C.R. Wie, C.R. Shi, M.H. Mendenhall, R.P. Livi, T. Vreeland Jr., T.A. Tombrello, Nucl. Instrum. Methods B 9 (1985) 20.
[7] D.K. Sood, J.E.E. Baglin, Nucl. Instrum. Methods B 19/20 (1987) 954.
[8] J. Melngailis, J. Vac. Sci. Technol B5 (1987) 469.

 

=================================================================================

The book editor and authors welcome your comments, suggestions, and papers, please click here for submission. Unless it is specified on the page, the author of the current page is Dr. Liao.



 
 
 
Copyright (C) 2006 GlobalSino, All Rights Reserved