Mean Free Path of Auger Electrons
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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The relatively short mean free path of the Auger electrons in bulk solids (on the order of few nanometers) means that only those produced near the surface layer can escape to the free space to be collected. This restricts the application of Auger spectroscopy to surface study.

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.