This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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The relatively short mean free path of the Auger electrons in bulk solids (on the order of few nanometers) means that only those produced near the surface layer can escape to the free space to be collected. This restricts the application of Auger spectroscopy to surface study.