This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, and managers.

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Basically, EELS (Electron Energy Loss Spectroscopy) is converted to light using a transmission phosphor, then converted to electrons using a photomultiplier for serial acquisitions or using a position-sensitive-detector for parallel acquisition, either a self-scanned photodiode array (PDA) or a charge-coupled device (CCD) [1 - 2]. The latter system has many advantages: 1) produce a full two-dimensional image of the spectrum; 2) capture energy-filtered microdiffraction patterns.

[1] O. L. Krivanek, C. C. Ahn & R. B. Keeney, Ultramicroscopy 22, 103 (1987).
[2] D. McMullan et al., Further development of a parallel EELS CCD detector for a VG HB501 STEM in EUREM 92 Paris (1992).