Electron microscopy
 
Accuracies in EM Measurements
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   https://www.globalsino.com/EM/        


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Some common factors affecting the accuracies of all the EM measurements are:
         i) the fluctuation of electron beam current. In general, simultaneous data acquisition is a good technique to avoid such effects so that the data is independent of fluctuations of beam current with time.
         ii) the specimen drift.

 

 

 

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