Chapter/Index: Introduction | A |
B |
C |
D |
E |
F |
G |
H |
I |
J |
K |
L |
M |
N |
O |
P |
Q |
R |
S |
T |
U |
V |
W |
X |
Y |
Z |
Appendix
Accuracies in EM Measurements
| Some common factors affecting the accuracies of all the EM measurements are:
i) the fluctuation of electron beam current. In general, simultaneous data acquisition is a good technique to avoid such effects so that the data is independent of fluctuations of beam current with time.
ii) the specimen drift.
|
