Practical Electron Microscopy and Database

Bulk plasmon scattering cross section generated by fast electrons can be simulated by Algortihm for Elastic-Inelastic Multislice Method using Monte Carlo application. [1] Such simulation can be used to obtain:
         i) the energies of plasmon peaks as a function of sample thickness,
         ii) intensity ratio of 2^nd plasmon to 1^st plasmon peaks,
         iii) atomic innershell ionization. [2,3]

[1] Mkhoyan, K. A.; Babinec, T.; Maccagnano, S. E.; Kirkland, E. J.; Silcox, J., Separation of bulk and surface-losses in low-loss EELS measurements in STEM. Ultramicroscopy 2007, 107, 345-355.
[2] J.C.H. Spence, Optik 57 (1980) 451.
[3] C. Dwyer, Multislice theory of fast electron scattering incorporating atomic inner-shell ionization, Ultramicroscopy 104, 141–151, (2005).