Practical Electron Microscopy and Database

High-resolution EBSD enables the measurement of strain with good sensitivity. [1-4] In this case, the strain is measured relative to a reference strain-free area.

[1] Wilkinson AJ, Meaden G, Dingley DJ, High resolution mapping of strains and rotations using electron backscatter diffraction. Mater Sci Technol 22:1271–1278, (2006).
[2] Wilkinson AJ, Meaden G, Dingley DJ, High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity. Ultramicroscopy 106: 307–313, (2006).
[3] Vaudin MD, Gerbig YB, Stranick SJ, Cook RF, Comparison of nanoscale measurements of strain and stress using electron back scattered diffraction and confocal raman microscopy. Appl Phys Lett 93:193116, (2008).
[4] Villert S, Maurice C, Wyon C, Fortunier R, Accuracy assessment of elastic strain measurement by EBSD. J Microsc 233:290–301, (2009).