Practical Electron Microscopy and Database

Jump ratio method takes the ratio between a post-edge and a pre-edge window and is useful where the background shape prior to the edge is perturbed. However, it requires the edge to have a significant intensity above the background before the edge.

The characteristics of jump ratio technique are:
         i) Different from the three window method, jump ratio imaging is not quantitative, but instead, it is only qualitatively indicative of elemental distributions.
         ii) Jump ratio imaging is particularly susceptible to artifacts because it is sensitive to changes in the preceding background arising from thickness changes of the sample or from preceding ionization edges.