Jump Ratio Method in EELS Measurement
- Practical Electron Microscopy and Database - - An Online Book - |
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Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
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Jump ratio method takes the ratio between a post-edge and a pre-edge window and is useful where the background shape prior to the edge is perturbed. However, it requires the edge to have a significant intensity above the background before the edge. The characteristics of jump ratio technique are:
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