Electron microscopy
  
Rotation Method for Three Dimensional (3D) Electron Diffraction Recording
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Automatic rotation method for electron diffraction has been developed to collect three-dimentional (3D) electron diffraction data [1]. This method tilts the electron beam while the direct beam is kept at the same position on the specimen. With this setup, more than 1500 electron diffraction frames, covering an angular range of 145°, can be collected in 60 min. Figure 1300 shows an example of diffraction series recorded with such method.

Figure 1300. Difraction frames recorded at high precision beam tilt series performed by rotation method on a high-silica zeolite SSZ-48 (space group P21) TEM specimen . The electron beam was tilted away from the [001] zone axis at 0°, while the direct beam was kept at the same position on the specimen. [2]

 

 

 

 

 

 

 

[1] D. L. Zhang, P. Oleynikov, S. Hovm¨ oller and X.D. Zou, Z. Kristallogr., 2010, 225, 94.
[2] Junliang Sun and Xiaodong Zou, Structure determination of zeolites and ordered mesoporous materials by electron crystallography, DOI: 10.1039/c0dt00666a.

 
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