Near Edge X-Ray Absorption Fine Structure (NEXAFS)
- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


Near Edge X-Ray Absorption Fine Structure, NEXAFS, (also called X-Ray Absorption Near Edge Structure, XANES) spectroscopy represents the absorption fine structure close to an absorption edge. A NEXAFS spectrum can be recorded by scanning the incident X-ray photon energy across a core absorption edge and measuring the probability for photon absorption by the sample. This process can be evaluated indirectly through the emission of secondary electrons, fluorescent photons or by directly measuring the photon transmission through the sample. Today, the term NEXAFS is typically used for soft x-ray absorption spectra, while XANES for hard x-ray spectra.

Both ELNES and NEXAFS measure the electric dipole transitions from a selected core-orbital to unoccupied states.



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