Streaking/Noise Artifact in TEM/STEM Images - Practical Electron Microscopy and Database - - An Online Book - |
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Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
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Artifacts can exist in the low dose TEM/STEM images. For instance, the STEM image in Figure 1412 only has thousands of counts (normally millions of counts for good data acquisitions) so that the image is streaking and noisy and does not present a clear structure of the TEM specimen.
In general, the streaking and noise mechanisms are very complicated and the troubleshooting process is very time-consuming if you are not lucky. For instance, the origins of such artifacts are mainly:
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