|
|
Phase Shift of Incident Electrons Induced by TEM Specimen
- Practical Electron Microscopy and Database -
- An Online Book -
|
|
https://www.globalsino.com/EM/
|
|
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
|
=================================================================================
The phase shift of the TEM electron beam after penetrating through the specimen depends on the local mass thickness and local variations in density caused by defects, resulting in variations in electron intensity.
|
=================================================================================
The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Yougui Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
|
|
