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Uneven Illumination Effect on Fourier Transform in TEM
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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Uneven illumination across the TEM specimen affects the low-frequency Fourier components in Fourier transform patterns. It happens often that the specimen is non-uniformly illuminated when the highest possible current density is applied by focusing the electron beam to a small spot.
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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Yougui Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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