Uneven Illumination Effect on Fourier Transform in TEM
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


Uneven illumination across the TEM specimen affects the low-frequency Fourier components in Fourier transform patterns. It happens often that the specimen is non-uniformly illuminated when the highest possible current density is applied by focusing the electron beam to a small spot.




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