Analysis of Short-Range Properties of Materials
- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


The short-range properties of materials, e.g. of amorphous materials, can be characterized by a variety of techniques such as vibrational spectroscopies, magnetic resonance, inelastic scattering, and diffraction. The analysis needs to differentiate between the natural amorphous randomness and the defective structure.




The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Yougui Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.

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