Electron microscopy
EELS Analysis of Ferroelectric Materials
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   https://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


In EELS, perovskite type ferroelectric and high-k dielectric materials, such as BaTiO3 and SrTiO3, normally show only one interband plasmon peak [1–4].





[1] K.S. Katti, M. Qian, F. Dogan, M. Sarikaya, J. Am. Ceram. Soc. 85 (2002) 2236–2243.
[2] K. van Benthem, C. Elsasser, R.H. French, J. Appl. Phys. 90 (2001) 6156–6164.
[3] S. Schamm, G. Zanchi, Ultramicroscopy 88 (2001) 211–217.
[4] J. Zhang, A. Visinoiu, F. Heyroth, F. Syrowatka, M. Alexe, D. Hesse, H.S. Leipner, Phys. Rev. B 71 (2005) 064108.



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