Aberration Coefficients Reflected in Ronchigram
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


Using "Ronchigrams" somewhat similar to convergent beam electron diffraction. However, unlike the CBED pattern, a Ronchigram is obtained using a large aperture angle, so the diffraction disks overlap considerably. Phase interferences of the different beams occur in the Ronchigram and vary with focus. In this method, a set of Ronchigrams acquired at different focus settings can characterize the lens aberrations.




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