Correction of Astigmatism of Objective
Lens in TEM based on Diffractogram
- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


The astigmatism of objective lens in TEM can be corrected based on diffractogram at high magnifications [1]. This method requires an amorphous phase of a thin region in a sample.



[1] D.B.Williams,C.B.Carter,TransmissionElectronMicroscopy,PlenumPress, NewYork,1996.



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