Operations of Electron Microscopes
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


In modern EMs, by taking advantage of computer control, it is convenient to switch between different operation modes, such as SEM, STEM, bright-field and dark-field TEM, nanobeam electron diffraction (NBED), and CBED, once their lens settings have been preset.




The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Yougui Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.

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