Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
| As an example, Table 2389 lists the electronic properties that are affected by structural disorders in amorphous and crystalline Si. Table 2389. The electronic properties affected by structural disorders in amorphous and crystalline Si.
Figure 2389 shows the typical sizes of various material defects and the capability of analytical techniques (See the full names of the techniques at page3928). The lowest levels of the techniques represent their spatial resolutions.
Figure 2389. Typical sizes of various material defects and capability of analytical techniques.
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