Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Comparison between CBED and Electron Holography

Table 2408. Comparison between CBED and electron holography. 

CBED
Electron holography
Effect of bending due to specimen-thinning
More effect due to broadening and splitting of HOLZ lines
 
Less effect in ZOLZ condition
Strain quantification & mapping
Difficult; complex theories
Easier: beneficial for mapping strain gradient
Operation
Less time-consuming
Time-consuming