Practical Electron Microscopy and Database

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Semiconductor Device Performances

Many important structural parameters of materials can modify semiconductor device performance. These parameters include:         i) The micro-structures, such as crystalline and amorphous phases,         ii) The dimensions of multilayers,         iii) The imperfections,         iv) The chemical compositions, e.g. dopants.