This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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In TEM, when the transmitted beam and a diffracted beam (e.g. from (hkl) plane) pass through a large objective aperture, interference takes place between the transmitted and diffracted beam, resulting in one-dimensional (1D) lattice fringes of the (hkl) plane. When more diffracted beams together with the transmitted beam pass through, then two-dimensional (2D) high-resolution lattice fringes are obtained.