This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Figure 2761 shows the position of the deflector applied to image-shift function in TEM. This function is mostly useful when a small change of interesting area is needed during high resolution imaging.

Figure 2761. Schematics illustrating the position of the deflector applied to image-shift function in TEM.

In the technique of precession electron diffraction (PED), to obtain a stationary diffraction pattern instead of ring reflections, a simultaneous descan of the diffracted beam is needed by means of image shift TEM coils.