Damage of TEM Specimen Holder
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


TEM specimen holders can be damaged, for instance, due to improper installation of specimens. As an example, Figure 2770 shows a good JEM JEOL double tilt holder and a similar but destroyed double tilt holder. A spring for supporting the y-tilt and the two screws for the specimen support were broken due to improper installation of a specimen or during pulling out the holder from the TEM system if the tilted holder had not been neutralized. The cost of repair can be very high, e.g. $ 3,000 to 5,000 for a single repair of a double tilt holder is very normal. Fortunately, some holders, e.g. single tilt holder, are not so easily damaged.

Destroyed JEM JEOL 2010 double tilt holder

Figure 2770. Comparison between two JEM JEOL double tilt holders: (a) Good, and (b) Destroyed.




The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.