Voltage of Incident Electrons for EELS Measurements
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


EELS measures the distribution of energies lost by incident electrons (typically 100 - 1000 keV) as they pass through a thin solid specimen (typically 0.5–50 nm).




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