Electron microscopy
Problems/Damage of Apertures
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   https://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


Problems of objective apertures:

Problems can occur on the fine, coarse, or both positioning mechanisms of objective aperture strip. For instance, in some problems, only two of three positions (#1, #2, and #3) can be obtained. However, in some cases, instead of being able to have apertures #1, #2, #3, and OPEN with the full function, one has nothing, #1, #2, and OPEN or other combinations. For trouble shooting, EDS detection can help diagnose what is the problem.

Furthermore, the aperture strip can also be damaged or even drop down into the microscope column if the strip was twisted incorrectly during manual operation.



The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.