Chemical Bonding
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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ELNES (near-edge fine structure) mapping is enabled by the fact that chemical bonding and short-range order in the environment of a specific chemical element induce a chemical shift of the energy-loss edge in the range between 0.1 and 8 eV and modifies the ELNES of the electron energy-loss spectrum. Therefore this method can differentiate between compounds of the same binary or multi-component system but with different bonding and valency.

Note that, in EELS analysis, high energy-resolution is necessary to observe ELNES for investigating the chemical bonding.

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.