These EEL spectra can be deconvoluted by Fourier-log method  to remove the multiple-scattering components from the spectra and then be background-subtracted by fitting the pre-edge background with a power-law function . Note that different from Fourier-ratio method, the Fourier-log technique uses the entire spectra from the zero loss peak to beyond any edge of interest.
 D. W. Johnson and J. C. H. Spence, J. Phys. D 7, 771 (1974).
 R. F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope (Plenum, New York, 1986), pp. 259—261.