Preferred Orientation on X-ray Diffraction Patterns
- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


The problem due to preferred orientation is serious in X-ray diffraction. Due to the preferred orientation some peaks can completely be missing and the intensity of some peaks can be very misleading. The preferred orientation also can substantially alter the appearance of the powder pattern. For instance, powder X-ray diffraction, due to the typical preferential orientation of the misfit compounds, gives a very partial information of the samples.




The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.

Copyright (C) 2006 GlobalSino, All Rights Reserved