|
|
EM Image Simulations at High Spatial Resolutions
- Practical Electron Microscopy and Database -
- An Online Book -
|
|
https://www.globalsino.com/EM/
|
|
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
|
=================================================================================
EM image simulations can be employed to compare experimental images with model structures even at spatial frequencies above the point to point resolution, but this requires one to have an accurate idea and model about the sample structure from the beginning. [1]
[1] J. C. H. Spence, “The future of atomic resolution electron microscopy for materials
science,” Mater. Sci. Eng., vol. R26, pp. 1 – 49, 1999.
|
=================================================================================
The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. This appearance can help advertise your publication.
|
|
