Spatial Resolution Improved by Increasing
Accelerating Voltage in EMs
- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


By increasing the accelerating voltage in EMs it is possible to have the contrast transfer function (CTF) extend to higher spatial frequencies and thus have high spatial resolution. However, at the same time the microscope itself increases in size and cost and the samples will be damaged faster and more easily.




The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. This appearance can help advertise your publication.

Copyright (C) 2006 GlobalSino, All Rights Reserved