This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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Capacitive coupling voltage contrast (CCVC) was proposed by Crosthwait and Ivy in 1974 [1]. In this technique, the capacitive coupling between the surface and the conducting lines or electrodes enables us to detect the conductor arrangement below the insulating layer even with a non-penetrating e-beam. The weakness of this technique is that a bias is needed to apply to the testing device in order to switch the potential of observation points, and this type of image contrast disappears very quickly.

[1]