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Pixel Resolution for Recording CBED
(Convergent Beam Electron Diffraction) Patterns
- Practical Electron Microscopy and Database -
- An Online Book -
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http://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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CBED (convergent beam electron diffraction) measurements need very high pixel resolution for recording the diffraction patterns. The camera length normally should be selected as high as possible to obtain a highly resolved pattern. In this case, the zero-order disk of the CBED pattern can almost cover the entire CCD camera.
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