Evaluation of Grain Orientation based on Kikuchi Lines/Bands
- Practical Electron Microscopy and Database -
- An Online Book -

https://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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Computer-assisted imaging and analysis has been proven to play an important role on highly accurate quantification of distribution of grain orientations. For instance, the orientation of individual grains can be determined by detecting the position of Kikuchi bands in electron backscattering patterns. Thousands of patterns can be captured and evaluated so that the grain orientations can be mapped [1].

 

 

 

 

[1] Schwarzer, R.A. (1997) Automated crystal lattice orientation mapping using a computer-controlled SEM. Micron, 28 (3), 249–265.

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.