This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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The intensity of PED is an integral of diffraction intensities over a large range of deviation parameter s and thus, the zone axis pattern (e.g. [u vw]) looks aligned well even though the crystal zone axis of the TEM sample is not exactly aligned with respect to the incident electron beam.