This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. You can click How to Cite This Book to cite this book. Please let Dr. Liao know once you have cited this book so that the brief information of your publication can appear on the “Times Cited” page. This appearance can also help advertise your publication.
The energy resolution of a conventional EEL spectrometer is usually limited by geometric aberration. Curved entrance and exit edges of the magnetic prism spectrometer are usually made to appropriate radii to correct geometric aberration [1 - 2], for instance, curved entrance was used to design a TEM postcolumn imaging filter. However, the performance of curved edge depends highly on the machining tolerances and alignment accuracy [4–6].
 R. F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope,
2nd ed. (Plenum, New York, 1996), pp. 63–68.
 J. R. Fields, Ultramicroscopy 2, 311 (1977).
 O. L. Krivanek, A. J. Gubbens, N. Dellby, and C. E. Meyer, Microsc.
Microanal. Microstruct. 3, 187 (1992).
 R. F. Egerton, Optik 57, 229 (1987).
 T. T. Tang, Scan Electron Microsc. 1, 39 (1982).
 M. Sheinfein and M. Isaacson, Scan Electron Microsc. 4, 1681 (1984).