This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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Research and engineering applications of off-axis electron holography can be split into three main categories:
         i) Correct microscope aberration to achieve high spatial resolution.
         ii) Measure electric fields in materials at high spatial resolution.
         iii) Measure magnetic fields at high spatial resolution.