Practical Electron Microscopy and Database

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Electron Collision with Matter in TEM

For TEM (transmission electron microscope), the primary electron beam typically with voltages of 100 to 300 keV at convergence half angle α interacts with a specimen sufficiently thin so that the number of collision events remains low.