Sputtering of Silver from Electron Irradiation in EMs
- Practical Electron Microscopy and Database -
- An Online Book -



This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.



Preferential Electron-Beam Etching of Grain Boundaries can provide an explanation for the small but measurable sputtering observed from silver nnanoparticles (e.g. 6 – 14 nm in diameter) when exposed to 200 keV electrons [1].


[1] N. Braidy, Z. J. Jakubek, B. Simard, G. A. Botton, Microsc. Microanalysis 14 (2008) 166.



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