This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

=================================================================================

With high-brightness electron sources and aberration correctors, very large current density (> 10⁶ A/cm²) in electron microscopes (EMs), especially in TEMs, can be obtained within a small electron probe in diameter (< 1 nm), resulting in displacement damage in stationary analysis or scanning over a limited area.