Displacement of Atoms due to Electron Irradiation in EMs
- Practical Electron Microscopy and Database -
- An Online Book -



This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.



With high-brightness electron sources and aberration correctors, very large current density (> 106 A/cm2) in electron microscopes (EMs), especially in TEMs, can be obtained within a small electron probe in diameter (< 1 nm), resulting in displacement damage in stationary analysis or scanning over a limited area.



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